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Load balancing in a server farm [42] (courtesy Kluwer Academic Publishers).

1 1

An IEEE 802.15.3 WPAN is typically con gured as a piconet in which communications are con ned between DEVs located within the small area of

of Professor RL Anderson, an early hetero-junction researcher, I had my rst exposure to hetero-junction bipolar transistors, III V devices, and cryogenics, little did I know that time that I would be the rst one working on ESD protection of Silicon Germanium and Silicon Germanium Carbon devices ten years later At IBM, I was fortunate to have many mentors and friends from IBM Burlington Vermont, IBM East Fishkill, IBM TJ Watson Research Center, IBM San Jose, IBM Rochester, IBM Haifa Israel, and IBM RF Boston Design Center My early years in bipolar SRAM development was in uenced by Roy Flaker, Jack Gerbach, Russ Houghton, Jeffery Chu, Badih El-Kareh, John Aitken, Tak Ning, Denny Tang, George Sai-Halasz, Jack Y-C Sun, and Robert Dennard.

1 i

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In the RF CMOS and RF BiCMOS Silicon Germanium area, I would like to thank my peers who assisted in ESD work, invention, design kits, measurements, and technical support: Louis Lanzerotti, Robb Johnson, Peter Zampardi, Ephrem G Gebreselasie, Amy Van Laecke, Stephen Ames, Susan E Strang, Donald Jordan, C Nicholas Perez, David S Collins, Doug Hershberger, Alan Norris, Arnold Baizley, Bradley Orner, Michael Zierak, Robert Rassel, Peter B Gray, Ben T Voegeli, QZ Liu, JS Rieh, John He, Jay Rascoe, Xue Feng Liu, Doug Coolbaugh, Natalie Feilchenfeld, Dawn Wang, JS Lee, Stephen St Onge, Alvin Joseph, James Dunn, David Harame, Gary Patton, and Bernard Meyerson.

16:31

In the ESD discipline, I would like to thank for the years of support and the opportunity to provide lectures, invited talks, and tutorials on ESD and latchup; from the SEMATECH ESD group, the Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symposium, the International Reliability Physics Symposium (IRPS), the Taiwan Electrostatic Discharge Conference (T-ESDC), the International Physical and Failure Analysis (IPFA), the International Conference on Electromagnetic Compatibility (ICEMAC), the Bipolar/BiCMOS Circuit and Technology Meeting (BCTM), and the International Solid State Circuit Conference (ISSCC), as well as ESD Association Education Committee, and the ESD Association Device Testing Standards Committees I would like to thank the ESD Association of ce for the support in the area of publications, standards developments, and conference activities, with a special thanks to Lisa Pimpinella In the eld of ESD in RF devices, I would like to thank Prof Elyse Rosenbaum (UIUC), Prof.

Double-click the wireless icon located in the lower-right corner of Windows. The wireless connection status window opens.

#ifndef __MONTH_H_ #define __MONTH_H_ #define MAX_STRING_LENGTH 129 #define IsMultiSelect(hwnd) \ (GetWindowLong(hwnd, GWL_STYLE) & MCS_MULTISELECT) /Child control IDs #define IDC_EXIT 1024 #define IDC_TODAY 1025 #define IDC_MONTH 1026 #define ONE 0x01 TCHAR pszAppName[] = TEXT("MONTHSAMPLE"); TCHAR pszTitle[] = TEXT("Windows CE Month Calendar Control"); HINSTANCE ghInst; int nWidth; int nHeight; /* Define the various windows used in this application: hwndMain > The main application window. hwndExit > Exit button hwndToday > Goto Today button hwndMonth > Month calendar control */ HWND hwndMain; HWND hwndExit; HWND hwndToday; HWND hwndMonth; //MONTHDAYSTATEs for holidays

Ming-Dou Ker (NCTU), Karl Heinz Bock, Eugene Worley, Corrine Richier (ST Microelectronics), Marise BaFluer (CNRS), Ann Fletcher (RF MicroDevices), Patrick Juliano (Intel), and Kathy Muhonen (RF MicroDevices), and Sami Hynoven I would like to thank my summer students and ESD support in the RF ESD eld Patrick Juliano of UIUC, Brian Ronan of Princeton University, and Anne Watson of Penn State University for her hard work, collaboration, and participating in ESD and latchup experimentation, and discovery A special thanks to Ephrem G Gebreselasie for his hard work and support, in both ESD and latchup in RF CMOS and RF BiCMOS SiGe development I would also like to thank the publisher John Wiley & Sons, Ltd and its staff in Chichester, Taiwan, Singapore, and China for taking on this rst ESD book series.

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And most important a special thanks to my children, Aaron Samuel Voldman and Rachel Pesha Voldman, and my wife Annie Brown Voldman May we all ful ll what we want in our lives and walk a path of righteousness, justice, and truth And of course, my parents, Carl and Blossom Voldman Baruch HaShem B H Dr Steven H Voldman IEEE Fellow.

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